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View RPM

Problem

Description

You are here: Device Administration > RPM > View RPM.

You can configure the RPM probes, to view the RPM statistics and to ensure that the device is configured to receive and transmit TCP and UDP RPM probes on correct ports.

You can view the RPM configuration to verify the following information:

  • The RPM configuration is within the expected values.

  • The RPM probes are functioning and the RPM statistics are within expected values.

  • The device is configured to receive and transmit TCP and UDP RPM probes on the correct ports.

In addition to the RPM statistics for each RPM test, the J-Web interface displays the round-trip times and cumulative jitter graphically. In the graphs, the round-trip time and jitter values are plotted as a function of the system time. Large spikes in round-trip time or jitter indicate a slower outbound (egress) or inbound (ingress) time for the probe sent at that particular time.

Solution

To view RPM information:

  1. Enter the information specified in Table 1.

Table 1: RPM Information Troubleshooting Options

Field

Function
Currently Running Tests

Graph

Click the Graph link to display the graph (if it is not already displayed) or to update the graph for a particular test.

Owner

Configured owner name of the RPM test.

Test Name

Configured name of the RPM test.

Probe Type

Type of RPM probe configured for the specified test. Following are valid probe types:

  • http-get

  • http-get-metadata

  • icmp-ping

  • icmp-ping-timestamp

  • tcp-ping

  • udp-ping

Target Address

IP address or URL of the remote server that is being probed by the RPM test.

Source Address

Explicitly configured source address that is included in the probe packet headers.

If no source address is configured, the RPM probe packets use the outgoing interface as the source address, and the Source Address field is empty.

Minimum RTT

Shortest round-trip time from the J Series device to the remote server, as measured over the course of the test.

Maximum RTT

Longest round-trip time from the J Series device to the remote server, as measured over the course of the test.

Average RTT

Average round-trip time from the J Series device to the remote server, as measured over the course of the test.

Standard Deviation RTT

Standard deviation of round-trip times from the J Series device to the remote server, as measured over the course of the test.

Probes Sent

Total number of probes sent over the course of the test.

Loss Percentage

Percentage of probes sent for which a response was not received.
Round-Trip Time for a Probe

Samples

Total number of probes used for the data set.

The J Series device maintains records of the most recent 50 probes for each configured test. These 50 probes are used to generate RPM statistics for a particular test.

Earliest Sample

System time when the first probe in the sample was received.

Latest Sample

System time when the last probe in the sample was received.

Mean Value

Average round-trip time for the 50-probe sample.

Standard Deviation

Standard deviation of the round-trip times for the 50-probe sample.

Lowest Value

Shortest round-trip time from the device to the remote server, as measured over the 50-probe sample.

Time of Lowest Sample

System time when the lowest value in the 50-probe sample was received.

Highest Value

Longest round-trip time from the J Series device to the remote server, as measured over the 50-probe sample.

Time of Highest Sample

System time when the highest value in the 50-probe sample was received.
Cumulative Jitter for a Probe

Samples

Total number of probes used for the data set.

The J Series device maintains records of the most recent 50 probes for each configured test. These 50 probes are used to generate RPM statistics for a particular test.

Earliest Sample

System time when the first probe in the sample was received.

Latest Sample

System time when the last probe in the sample was received.

Mean Value

Average jitter for the 50-probe sample.

Standard Deviation

Standard deviation of the jitter values for the 50-probe sample.

Lowest Value

Smallest jitter value, as measured over the 50-probe sample.

Time of Lowest Sample

System time when the lowest value in the 50-probe sample was received.

Highest Value

Highest jitter value, as measured over the 50-probe sample.

Time of Highest Sample

System time when the highest jitter value in the 50-probe sample was received.

Related Documentation