[ Contents] [ Prev] [ Next] [ Index] [ Report an Error]

RPM Statistics

At the end of each test, the device collects the statistics for packet round-trip time, packet inbound and outbound times (for ICMP timestamp probes only), and probe loss shown in Table 226.

Table 226: RPM Statistics

RPM Statistics

Description

Round-Trip Times

Minimum round-trip time

Shortest round-trip time from the J-series or SRX-series device to the remote server, as measured over the course of the test

Maximum round-trip time

Longest round-trip time from the J-series or SRX-series device to the remote server, as measured over the course of the test

Average round-trip time

Average round-trip time from the J-series or SRX-series device to the remote server, as measured over the course of the test

Standard deviation round-trip time

Standard deviation of the round-trip times from the J-series or SRX-series device to the remote server, as measured over the course of the test

Jitter

Difference between the maximum and minimum round-trip times, as measured over the course of the test

Inbound and Outbound Times (ICMP Timestamp Probes Only)

Minimum egress time

Shortest one-way time from the J-series or SRX-series device to the remote server, as measured over the course of the test

Maximum ingress time

Shortest one-way time from the remote server to the J-series or SRX-series device, as measured over the course of the test

Average egress time

Average one-way time from the J-series or SRX-series device to the remote server, as measured over the course of the test

Average ingress time

Average one-way time from the remote server to the J-series or SRX-series device, as measured over the course of the test

Standard deviation egress time

Standard deviation of the one-way times from the J-series or SRX-series device to the remote server, as measured over the course of the test

Standard deviation ingress time

Standard deviation of the one-way times from the remote server to the J-series or SRX-series device, as measured over the course of the test

Egress jitter

Difference between the maximum and minimum outbound times, as measured over the course of the test

Ingress jitter

Difference between the maximum and minimum inbound times, as measured over the course of the test

Probe Counts

Probes sent

Total number of probes sent over the course of the test

Probe responses received

Total number of probe responses received over the course of the test

Loss percentage

Percentage of probes sent for which a response was not received


[ Contents] [ Prev] [ Next] [ Index] [ Report an Error]